Usage of Handheld XRF in Manufacturing QA/QC

Sponsored by: Olympus

Focused on:

  • Quality Control
  • Alloy Composition
  • Materials

Date: 2 November


Time: 3PM London/11AM New York

How to Verify Alloy Composition and Prevent Costly Material Mixups

Material mix-ups are a real threat to companies that rely solely on mill test reports (MTR) to verify alloy identification and chemistry. This can create significant liabilities not only on the factory production line, but also in the safety and reliability of equipment that could fail once deployed in the field. Material mix-ups can occur throughout the entire supply chain, from the supplier to the warehouse through to the time it is actually installed and shipped. The ability to quickly and easily verify composition of metals and alloys at all points in the supply chain and manufacturing operations is essential for any business where the specification of alloys is critical to the performance and safety of the products they sell.

Handheld XRF (HH-XRF) analyzers are fast becoming common tools in manufacturing QA/QC procedures at many points in the production process to ensure metal and alloy materials used are exactly what has been specified. These tools are non-destructive, easy-to-use, fast and accurate.

In this webinar, we will provide an overview of handheld XRF technology and highlight some of the major advancements that have been deployed in the most recent systems being offered today. We will also give a broad review of the major HH-XRF applications in multiple industries with the specific focus on the advantages of its use in manufacturing QA/QC applications.

Presented by

Dillon McDowell,

Application Scientist

Dillon McDowell is an Applications Scientist at Olympus Scientific Solutions, specializing in using X-ray fluorescence (XRF) and other analytical technologies in alloy and regulatory (precious metals, RoHS, and consumer product safety) applications. Dillon has a BS in physics and MS in mechanical engineering from Northeastern University and has been published in the Journal of Material Chemistry C. Before joining Olympus, Dillon was a research assistant at Menon lab at Northeastern University and interned for a major inspection company. At Olympus, Dillon is focused on providing training and support to customers with challenging application needs.

Key Learning Objectives

  • How handheld XRF (HHXRF) analyzers work
  • Explanation of major HHXRF applications
  • Introduction of the Olympus Vanta HHXRF analyzer and how its advanced features enable customers to do more work better and faster
  • Specific advantages of the Vanta analyzer in manufacturing QA/QC applications


  • Senior Management
  • Project Management
  • Compliance
  • Regulation
  • Operations
  • Research & Development